SL8804-G Green surface inspection Lamp,Wafer dust particle defect inspection lamp: High illuminance LED surface inspection lamp. LCD screen surface inspection lamp.

SL8804-G Green surface inspection Lamp,Wafer dust particle defect inspection lamp: High illuminance LED surface inspection lamp. LCD screen surface inspection lamp.

Product introduction

Additional Information:

Tel: (852) 6740 3030; 0086-755-82153693
Fax: 0086-755-82483923
E-mail: info@sunlonge.com, sunlonge@gmail.com

Desktop wafer inspection lamp, High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp: High illuminance LED surface inspection lamp. LCD screen surface inspection lamp.

SL8804 series are with yellow ,green light source inspection lamp(white light optional). The principle: The LED source will emit special wavelength light source through the refraction of optical lens. With the light on the surface of sample, the inspector can detect the dust, scratches, glitch, ink etc. It can take the place of traditional lighting device and optical system machine. The inspector can detect the defect and flaws directly of test sample by the light source and human eyes. It can help greatly save the purchase cost. The SL8900 is with 510-590NM light source, which is sensitive to human vision, with the green and yellow compound light source. The illuminance can reach up to 50 000lx, meanwhile the lifespan can reach up to 30 000H. It can detect the dust particles in the 1um size range, which is 10 time powerful than the traditional inspection lamp.

SL8804-G Green surface inspection Lamp,Wafer Inspection Lamp

SPECIFICATIONS:

Model:SL8804-G Green surface inspection Lamp

1. Anodized high strength aluminum alloy, very durable

2.Use 4 pcs 5W 525 NM LED with lens, average LED life is 30,000 hours

3.light  Intensity:50000 lx  at 30cm

4.Irradiated Area in 45 cm Distance:Ø18

5.Power supply: 100-240   AC/50HZ

6:Irradiated Area in 45cm Distance:Ø20cm

7:Stability of Led Lamp: > 90%

8:Product Size: 116*108mm   ; WEIGHT :960g without  accessories

 

SL8804-G-3.jpg

Model Wafer dust particle defect inspection lamps. Wafer surface inspection lamp.SL8804-G Wafer dust particle defect inspection lamps. Wafer surface inspection lamp.Wafer dust particle defect inspection lamps. Wafer surface inspection lamp. Remark
LED NO and specification 4 pcs 5W 525 NM LED with lens and white side light4 pcs 5W 525 NM LED with lens and white side light We can customize

 

The lamp according to your demand

(365NM;455NM;595NM;625NM optional)
Wavelength 525NM LED
Illuminance  

 

48000LX→at   45cm distance; 680000LX→at   30cm distance

Irradiated area Ø 16.8 cm →at   40cm distance
Dimming Infinite   dimming, 0%~~100% by the modulator
lifespan 30000H
Size and weight 116*108MM,   Weight: 0.96Kg without accessories
accessory protective   glassed

Feature:

  1. Lifespan up to 30 000H, 10 time longer than the mercury-vapor light.
  2. White light or green yellow light, sensitive but do not to harm the human vision. Detect the scratches and dust particles at the 10um size range.

3.Mechanical cooling. Provide stable and high illuminance special wavelength light source.

4.You can choose different wavelength light source (365NM,455NM,525NM,595NM,625NM,6000K optional

Applications: 

Quality inspection of TFT-LCD panel.

Quality inspection of color filters,touch panel

Quality inspection of Cell Gap MURA

Inspection of  film thinkness

Examination of surface flathess

Examination of optical film materials

Surface evenness and  bubble inspection of polarizer attching.

 

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